Section outline

    • X-ray diffraction: basic concepts about the physics of diffraction. Bragg's law. Ewald sphere and reciprocal lattice. Symmetry of the reciprocal lattice. Laue classes. Systematic absences. Anomalous scattering. 

    • Instruments: X-ray source, optical components of the diffractometer, goniometer, detector. Crystal cooling for cryocrystallography. Crystal centering. The diffraction experiment. Optimization of the data collection parameters. Indexing. Integration. Space group determination. Scaling and merging. Data quality evaluation. Radiation damage. Twinning. (Notes on Serial Femtosecond Crystallography, SFX, with X-ray Free Electron Laser, X-FEL.)